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, Eichinger, P, Bauer, T, Kotz, L and Staudigl, R Sub-ppm monitoring of transition metal contamination on silicon wafer surfaces by VPD-TXRF ECS Proceedings, PV88-20, The Electrochemical Society, Pennington, NJ, 1988, pp 109 112 Pahlke, S, Kotz, L, Ehmann, T, Eichinger, P and Huber, A WSPS: wafer surface preparation system A novel modular automated method capable of the ultratrace analytical inspection of 300 mm silicon wafer surfaces ECS Proceedings, PV98 1, The Electrochemical Society, Pennington, NJ, 1998, pp 1524 1525 http://wwwgemeteccom/ http://wwwses-corpcojp/en/ Fabry, L, Pahlke, S, Kotz, L, Wobrauschek, P and Streli, C Novel methods of TXRF analysis for silicon wafer surface inspection Fresenius J Anal Chem, 363, 98 102 (1999) Hockett, R S, Ikeda, S and Taniguchi, T TXRF round robin results ECS Proceedings, PV92-12, The Electrochemical Society, Pennington, NJ, 1992, pp 324 337.

what the spectrum analyzer is required to measure, as will be shown in later examples. The power measurement uncertainty of the Agilent PSA E4440 discussed in 9 is compared in Table 13.1 with that of the Agilent 8586E, which was a top of the line spectrum analyzer in the late 1990s. The major design changes that give the PSA E4440 spectrum analyzer its improved performance are Flat frequency response Digital IF section with digital resolution bandwidth, digital log amp, digital video bandwidth, digital detector Same 50 MHz power reference as used in power meters Examples of Measurement Uncertainty of PSA 4440E Spectrum Analyzer Under Different Measurement Conditions 1. Measurement of 900 MHz CW signal at 25 dBm Reference level uncertainty: +0:27 dB Frequency response uncertainty: +0:38 dB RSS uncertainty: +0:48 dB 2. Measurement of 10 GHz fundamental with its second harmonic at 20 GHz Frequency response uncertainty at 10 GHz: +1:0 dB Frequency response uncertainty at 20 GHz: +2:5 dB 3. Measurement uncertainty due to mismatch: DUT output port: r1 0:167 PSA input port: r2 0:4 (Because of its wide frequency coverage, the sensor match of the spectrum analyzer is very poor:) Spectrum analyzer input attenuator setting: 0 dB Measurement uncertainity: +0:59 dB If the spectrum analyzer attention setting is increased to 10 dB, to reduce its sensor mismatch, the mismatch measurement uncertainty is reduced from +0.59 to +0.13 dB.

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GroupBox This control is typically used to logically group controls together inside a frame. However, there is no ownership relationship. A common use is for mutually exclusive groups of radio buttons. The GroupBox control inherits directly from the Control class. Table 27-

UC Standardization Committee UC Standard: Test method for measuring surface contamination on silicon wafers by total re ection X-ray uorescence spectroscopy, Ultra Clean Technology, 8, 44 82 (1996) Horie, S et al Progress of ISO standardization activity on TXRF method 1: Report on RRT2 (Collecting method of surface metal) Extended Abstracts (The 48th Spring Meeting 2001), The Japan Society of Applied Physics and Related Societies, Meiji University, 2001, p 839 (31a-D-1) Mori, Y and Uemura, K Error factors in quantitative total re ection X-ray uorescence analysis X-Ray Spectrom, 28, 421 426 (1999) Hourai, M, Naridomi, T, Oka, Y, Murakami, K, Sumita, S, Fujino, N and Shiraiwa, T A method of quantitative contamination with metallic impurities of the surface of a silicon wafer Jpn J Appl Phys, 27, L2361 L2363 (1988) Kondo, H, Ryuta, J, Morita, E, Yoshimi, T.

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and Shimanuki, Y Quantitative analysis of surface contaminations.

When working with any manufacturing process, some secondary processes are generally required. For example, if you have a cast part, you may need to machine the rough surface to create a flat face in some areas. You may also need to ream or tap holes. In plastic parts, you may need to press in threaded inserts. SolidWorks includes special tools you can use to document secondary operations:

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If you are upgrading from Windows XP, you may recall that you could use one of three file system types: FAT, FAT32, and NTFS; however, you most likely are using NTFS. If your last upgrade has been a while, a file Watch Out!

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RFIC (RADIO FREQUENCY INTEGRATED CIRCUIT) AND SOC (SYSTEM ON CHIP)

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